PLATO is a non-destructive mapping measurement system that using PL(Photoluminescence) phenomenon.
Micro-LED is one of the areas that are expected to be developed in the future, as it is technically and theoretically ideal for the next generation display.
Internal defects, which are not observed in conventional microscope images, have a significant effect on product yield…
PyroCurveSense measures reflectivity of three different wavelengths, which is used to calculate Epi-Growth Rates and Thin-film thickness.
OPM Series are spectral transmittance or reflectance measurement system.
MFS is a table-type reflectance and thickness measuring device for thin film.