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LED

LED

PLATO is a non-destructive mapping measurement system that using PL(Photoluminescence) phenomenon. The measurable spectral range of PL is from UVC to NIR.
Micro-LED is one of the areas that are expected to be developed in the future, as it is technically and theoretically ideal for the next generation display. This device is suitable for measuring chips that are getting smaller in size by several micrometers as the resolution is getting higher and higher.
PLATO is a non-destructive mapping measurement system that using PL(Photoluminescence) phenomenon. The measurable spectral range of PL is from UVC to NIR.
Micro-LED is one of the areas that are expected to be developed in the future, as it is technically and theoretically ideal for the next generation display. This device is suitable for measuring chips that are getting smaller in size by several micrometers as the resolution is getting higher and higher.
PyroCurveSense measures reflectivity of three different wavelengths, which is used to calculate Epi-Growth Rates and Thin-film thickness.