• Application : MOCVD, MBE, Thermal CVD• Materials : Si, Ga(Al, In)N, SiC, GaAs, InP• Monitoring : Emissivity corrected temperature, reflectivity and curvature• Reflectivity : Three different wavelengths : 405, 633, 950nm• Analysis : Growth rate and thickness• Multi-channel : Up to 3 optical heads• User-friendly program interface