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APPLICATIONS

APPLICATIONS

PLATO is a non-destructive mapping measurement system that using PL(Photoluminescence) phenomenon. The measurable spectral range of PL is from UVC to NIR.
Micro-LED is one of the areas that are expected to be developed in the future, as it is technically and theoretically ideal for the next generation display. This device is suitable for measuring chips that are getting smaller in size by several micrometers as the resolution is getting higher and higher.
PLATO is a non-destructive mapping measurement system that using PL(Photoluminescence) phenomenon. The measurable spectral range of PL is from UVC to NIR.
Micro-LED is one of the areas that are expected to be developed in the future, as it is technically and theoretically ideal for the next generation display. This device is suitable for measuring chips that are getting smaller in size by several micrometers as the resolution is getting higher and higher.
PyroCurveSense measures reflectivity of three different wavelengths, which is used to calculate Epi-Growth Rates and Thin-film thickness.

PLATO is a non-destructive mapping measurement system that using PL(Photoluminescence) phenomenon. The measurable spectral range of PL is from UVC to NIR.

Internal defects, which are not observed in conventional microscope images, have a significant effect on product yield, but can be detected by the PL image of MiPLATO.

PLATO is a non-destructive mapping measurement system that using PL(Photoluminescence) phenomenon. The measurable spectral range of PL is from UVC to NIR.

OPM series is automatic transmittance or reflectance measurement system for the optical glasses/filters.
(OPM-300T series is for the T%, OPM-300R is for the R%)

The OPM series allows samples to be measured in seconds using a CCD array spectrometer.

MiFilmSense(MFS) is manual loading, tabletop type reflectance and thin film thickness measurement system.
With a confocal optical module, MFS can measure accurate single surface of the optical substrates(front or rear side surface).
With a built-in camera, MFS can focuses easily that to be measured.
User preset specification could be displayed on the R% result graph at the same time of the measurement which helpful to judge the product quality.
Measurable spectral range is from 380 nm to 1050 nm or optionally extended to 1500 nm.